Mapping and control of atomic force on Si(1 1 1)√3×√3–Ag surface using noncontact atomic force microscope

We demonstrated the possibility of measuring the three-dimensional force-related map with true atomic resolution between an Si tip and Si(1 1 1)√3×√3–Ag sample surface by measuring the tip–sample distance dependence of noncontact atomic force microscope (NC-AFM) image, i.e. atomically resolved atomic force spectroscopy. Furthermore, we demonstrated the possibility of controlling the interaction force between the atom on the tip apex and a sample atom of Si(1 1 1)√3×√3–Ag surface on an atomic scale by placing an Ag atom on the Si tip apex instead of Si atom.