Surface characterization of nanostructured metal and ceramic particles

In the present study, nanocrystalline Al, TiN and SiC particles produced by different techniques were examined using X-ray diffraction analysis, scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The average particle size and size distribution were measured for these nanoparticles. In addition, the surfaces of these particles were characterized by X-ray photoelectron spectroscopy (XPS) and high resolution transmission electron microscopy. An amorphous layer was normally found to form on the surface of the nanocrystalline particles. The layer thickness, depending upon the material, is sometimes non-uniform. The chemical states of the surface atoms on Al, TiN, and SiC were also determined by XPS.