Title of article :
Real-time atomic force microscopy in lubrication condition
Author/Authors :
Lee، نويسنده , , Hyunsoo and Lee، نويسنده , , Donghyeok and Kim، نويسنده , , K.B. and Seo، نويسنده , , Yongho and Kim، نويسنده , , Hyunsook and Lee، نويسنده , , Haiwon، نويسنده ,
Pages :
5
From page :
826
To page :
830
Abstract :
We have studied frictional force and wear problem in real-time atomic force microscopy in contact-mode using a resonator type mechanical scanner allegedly reported. The fast scanning may cause wear in the sample surface or the tip, and may deteriorate the image quality. Mineral oil was used to make a lubricious surface on a polycarbonate sample, and it was found that the interfacial frictional force was decreased. A Si tip which was coated with a hydrophobic film by means of chemical modification was confirmed to diminish the frictional force in the fast scanning process. The resultant image quality was improved due to reduced friction and wear.
Keywords :
Fast scanning , Real-time , atomic force microscopy , Lubrication condition , tip modification , AFM
Journal title :
Astroparticle Physics
Record number :
2050188
Link To Document :
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