Title of article
A SAXS study of the precipitation of nano-clusters in Si-C amorphous films
Author/Authors
Wang، نويسنده , , Ying and Kamiyama، نويسنده , , Tomoaki and Suzuki، نويسنده , , Kenji، نويسنده ,
Pages
5
From page
94
To page
98
Abstract
The structural evolution of amorphous Si-C films, which were prepared by floating a polycarbosilane solution on water and heat-treated at the temperatures 700, 800, 900 and 1000 °C, was investigated by small-angle X-ray scattering (SAXS). The isotropic SAXS profile for the Si-C films can be decomposed to two parts of scattering patterns, one has a sharp increase at h < 0.07 Å−1 and the other has a broad maximum at about h = 0.3 Å−1 in the same manner as for Si-C fibres. The Vickers hardness of the films is correlated to the characteristic variations in their medium-range structure.
Keywords
Si-C amorphous films , small angle X-ray scattering , nanoclusters
Journal title
Astroparticle Physics
Record number
2050878
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