Author/Authors :
Sekatskii، نويسنده , , S.K. and Mironov، نويسنده , , B.N. and Lapshin، نويسنده , , D.A. and Dietler، نويسنده , , G. and Letokhov، نويسنده , , V.S.، نويسنده ,
Abstract :
It is shown that field emission microscopy and related methods can be used to analyze the metal coated fiber tips, which nowadays are the most frequently used sensor for the scanning near-field optical microscopy (SNOM). Metal free and thus non field-emitting aperture for the light transmission on the tip apex can be directly seen and its parameters can be measured, which is very important for the interpretation of SNOM data.
