Title of article :
AFM studies of environmental effects on nanomechanical properties and cellular structure of human hair
Author/Authors :
Bhushan، نويسنده , , Bharat and Chen، نويسنده , , Nianhuan، نويسنده ,
Abstract :
Characterization of cellular structure and physical and mechanical properties of hair are essential to develop better cosmetic products and advance biological and cosmetic science. Although the morphology of the cellular structure of human hair has been traditionally investigated using scanning electron microscopy and transmission electron microscopy, these techniques provide limited capability to in situ study of the physical and mechanical properties of human hair in various environments. Atomic force microscopy (AFM) overcomes these problems and can be used for characterization in ambient conditions without requiring specific sample preparations and surface treatment. In this study, film thickness, adhesive forces and effective Youngʹs modulus of various hair surfaces were measured at different environments (humidity and temperature) using force calibration plot technique with an AFM. Torsional resonance mode phase contrast images were also taken in order to characterize the morphology and cellular structure changes of human hair at different humidity. The correlation between the nanomechanical properties and the cellular structure of hair is discussed.
Keywords :
Atomic force microscopy (AFM) , Torsional resonance (TR) mode , Youngיs modulus , environmental effect , Human hair
Journal title :
Astroparticle Physics