In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics

In situ transmission electron microscopy (TEM) technique was developed to examine micromechanisms of the electric fatigue in ferroelectric ceramics. The technique was based on a specially designed specimen connected to a modified TEM heating stage. With this technique, domain switching and nanodomain alignment near crack-like flaws were observed under cyclic electric fields. Following repeated electric cycles, microcracks were found to develop along domain and grain boundaries.