Author/Authors :
Studenikin، نويسنده , , S.A. and Protasov، نويسنده , , D.Yu. and Kostyuchenko، نويسنده , , V.Ya. and Varavin، نويسنده , , V.S.، نويسنده ,
Abstract :
The photoconductive effect in crossed E → ⊥ B → fields together with the conventional photo-Hall method and multicarrier analysis were used for the characterization of thin p-CdxHg1 − xTe layers grown by molecular beam epitaxy (MBE). The described techniques provided information about recombination parameters of the films: surface recombination velocities, bulk lifetime and diffusion length.
