Scanning probe microscopy for the imaging and control of ferroelectric oxides

Using a combination of scanning probe techniques, including contact mode atomic force microscopy, electric force microscopy, piezoelectric microscopy, and scanning tunneling microscopy, the ferroelectric properties of ferroelectric/metallic oxide heterostructures (Pb(Zr0.52Ti0.48)O3/SrRuO3 and Sr(Ru0.37Ti0.63)O3/Pb(Zr0.2Ti0.8)O3) and atomically smooth epitaxial ferroelectric oxides (Pb(Zr0.2Ti0.8)O3 and Pb(Zr0.52Ti0.48)O3) have been studied. Ferroelectric domains in as-grown films were imaged with nanometer resolution, and the domain structure could be modified locally and reversibly. Using the local polarization field of the ferroelectric, nonvolatile, reversible field effects were induced in SrRuO3 at the submicron level, changing its sheet resistance by up to 300 ohms per square in a fashion that does not require any permanent electrical contacts or associated lithographic processing.