Atomic force microscopy study of a perovskite-type layered compound, (C6H5CH2CH2NH3)2CuCl4

The surface structure of a layered compound (C6H5CH2CH2NH3)2CuCl4 was examined by Atomic Force Microscopy (AFM) in ambient condition. Well-defined AFM images with no defects were obtained and the estimated cell dimensions from AFM experiments are well consistent with the powder X-ray diffraction data of a = 7.58Å, b = 7.24Å, and c = 38.70Å.