Title of article :
Electronic characterisation of oligomeric materials for thin film transistor applications
Author/Authors :
Salih، نويسنده , , A.J. and Haynes، نويسنده , , D.M. and Hepburn، نويسنده , , A.R.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1995
Pages :
2
From page :
2257
To page :
2258
Abstract :
Thin film transistors (TFTs) have been fabricated with active layers formed from a range of oligomeric materials. Characterisation of the devices indicate that the oligomers exhibit field effect mobilities in the range 10−7 to 10−5 cm2V−1s−1. The devices exhibit threshold voltages between 0 and 2 volts and an on / off current ratio of between 10 and 100.
Journal title :
Synthetic Metals
Serial Year :
1995
Journal title :
Synthetic Metals
Record number :
2069764
Link To Document :
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