Title of article :
Optical characterization of fullerite C60 thin films
Author/Authors :
Capozzi، نويسنده , , V. and Casamassima، نويسنده , , G. F. Lorusso، نويسنده , , G.F. and Minafra، نويسنده , , A. and Piccolo، نويسنده , , R. and Trovato، نويسنده , , M. T. Ganzerli Valentini، نويسنده , , A.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1996
Pages :
3
From page :
3
To page :
5
Abstract :
Transmission and reflectance spectra of fullerite C60 thin films deposited on quartz and Si substrates are presented. An Urbach tail of states is present below the absorption edge due to the disordered structure of films. Photoluminescence (PL) spectra have been measured from 10 to 300 K. The recombination line of a self-trapped exciton polaron and its phonon replicas are present in the PL spectra.
Keywords :
Fullerene , films , Optical properties
Journal title :
Synthetic Metals
Serial Year :
1996
Journal title :
Synthetic Metals
Record number :
2070050
Link To Document :
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