Title of article
Optical characterization of fullerite C60 thin films
Author/Authors
Capozzi، نويسنده , , V. and Casamassima، نويسنده , , G. F. Lorusso، نويسنده , , G.F. and Minafra، نويسنده , , A. and Piccolo، نويسنده , , R. and Trovato، نويسنده , , M. T. Ganzerli Valentini، نويسنده , , A.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 1996
Pages
3
From page
3
To page
5
Abstract
Transmission and reflectance spectra of fullerite C60 thin films deposited on quartz and Si substrates are presented. An Urbach tail of states is present below the absorption edge due to the disordered structure of films. Photoluminescence (PL) spectra have been measured from 10 to 300 K. The recombination line of a self-trapped exciton polaron and its phonon replicas are present in the PL spectra.
Keywords
Fullerene , films , Optical properties
Journal title
Synthetic Metals
Serial Year
1996
Journal title
Synthetic Metals
Record number
2070050
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