Title of article :
Morphology of p-Hexaphenyl thin films
Author/Authors :
Koch، نويسنده , , N. and Resel، نويسنده , , R. and Meghdadi، نويسنده , , F. and Leising، نويسنده , , G. and Reichmann، نويسنده , , K.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1997
Abstract :
The poly(p-phenylene) oligomer p-hexaphenyl is used in electroluminescent devices emitting intense blue light. The defined thin film crystal growth of hexaphenyl is studied under certain conditions. Thin films are grown by physical vapor deposition on various substrates (GaAs, ITO). The influence of the substrate temperature (room temperature to 170°C) and film thickness (up to 6000إ) on the nature of the crystal growth is studied. The film properties, like nucleation, coverage, crystal dimensions, shape and appearance, are characterized by scanning electron microscopy (SEM). We discuss the influence of the type of substrate and its surface on the film growth and morphology. The crystal structure of these films was determined by X-ray diffraction. The crystallitesʹ dimensions and surfaces are studied with atomic force microscopy (AFM).
Keywords :
Scanning electron microscopy , atomic force microscopy , Polycrystalline thin films
Journal title :
Synthetic Metals
Journal title :
Synthetic Metals