A study on the electrical switching mechanism in [TBA]x[Ni(dmid)2] thin film materials by XPS

A study on the electrical switching mechanism in [TBA]x[Ni(dmid)2] thin film materials, in which reproducible current-controlled bistable electrical switching and memory phenomena could be observed [1], by X-ray photoelectron spectroscopy (XPS) was reported. The effects of fabrication electrodes and preparation conditions of the sandwich structure devices on the switching behavior were presented as well.