Title of article :
AFM studies of polypyrrole film surface morphology I. The influence of film thickness and dopant nature
Author/Authors :
Silk، نويسنده , , Toomas and Hong، نويسنده , , Qi and Tamm، نويسنده , , Jüri and Compton، نويسنده , , Richard G.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1998
Pages :
6
From page :
59
To page :
64
Abstract :
In this paper the surface morphology of electrogenerated polypyrrole films of various thicknesses and dopant anions (chloride, sulfate, perchlorate and dodecylsulfate) as studied by atomic force microscopy under ex situ conditions is reported. The roughness characteristics of the film surface are determined and discussed.
Keywords :
Polypyrrole , atomic force microscopy , surface morphology , Dopant influence , Film Thickness
Journal title :
Synthetic Metals
Serial Year :
1998
Journal title :
Synthetic Metals
Record number :
2071744
Link To Document :
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