Title of article :
Electrical study of impurity states in conjugated polymers
Author/Authors :
Stallinga، نويسنده , , P. and Gomes، نويسنده , , H.L. and Jones، نويسنده , , G.W. and Taylor، نويسنده , , D.M.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 1999
Pages :
2
From page :
496
To page :
497
Abstract :
Schottky diodes resulting from an intimate contact of aluminum on electro-deposited poly(3-methylthiopene), PMeT, have been studied by admittance spectroscopy, capacitance-voltage and current-voltage measurements, and optically-induced current transients. The loss-tangents show the existence of interface states that can be removed by vacuum annealing, also visible in the transients. Furthermore, the CV curves donʹt substantiate the idea of movement of the dopant ions.
Keywords :
73.40.-c. PMeT , PACS numbers: 73.61.Ph , Electrical measurements , traps
Journal title :
Synthetic Metals
Serial Year :
1999
Journal title :
Synthetic Metals
Record number :
2072244
Link To Document :
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