Author/Authors :
Caro، نويسنده , , J. and Fraxedas، نويسنده , , J. and Santiso، نويسنده , ,
J. To-Figueras، نويسنده , , A. and Gorostiza، نويسنده , , P. and Sanz، نويسنده , , F.، نويسنده ,
Abstract :
Thin films of TTF-TCNQ have been grown on ex situ cleaved NaCl (001) and KCl (001) substrates by thermal evaporation in high vacuum. The films are polycrystalline and textured, composed of microcrystals with rectangular shape with the c* crystallographic axis perpendicular to the substrate. The in-plane texture of the films has been studied by X-ray diffraction (XRD) and the surface morphology has been analyzed by means of Scanning Electron Microscopy (SEM) and Tapping Mode Atomic Force Microscopy (TMAFM).
Keywords :
atomic force microscopy , Evaporation and sublimation , Polycrystalline thin films , Scanning electron microscopy , X-ray diffraction
