Title of article
Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films
Author/Authors
Flueraru، نويسنده , , C and Schrader، نويسنده , , S and Zauls، نويسنده , , V and Motschmann، نويسنده , , H and Stiller، نويسنده , , B and Kiebooms، نويسنده , , R، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2000
Pages
4
From page
603
To page
606
Abstract
We have investigated the optical properties of poly(para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported.
Keywords
atomic force microscopy , Experimental methods: ellipsometry , Materials
Journal title
Synthetic Metals
Serial Year
2000
Journal title
Synthetic Metals
Record number
2073716
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