Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films

We have investigated the optical properties of poly(para-phenylenevinylene) (PPV) prepared via the standard precursor route and poly(phenylquinoxalines) (PPQ). The complex refractive indices are (1,75-i.0.004) for PPQ and (1,62-i.0.002) for PPV. Atomic Force Microscopy and multiple angle of incidence ellipsometric investigations are reported.