Title of article :
Aging induced traps in organic semiconductors
Author/Authors :
Steiger، نويسنده , , J. and Karg، نويسنده , , S. and Schmechel، نويسنده , , R. and von Seggern، نويسنده , , H.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2001
Abstract :
Trap states in organic single layer devices have been detected by the method of thermally stimulated currents (TSC). These devices have been exposed to potentially harmful atmospheres of oxygen and humid nitrogen in order to investigate the influence of a
Keywords :
Thermally stimulated currents , Organic light emitting diodes , traps , Degradation
Journal title :
Synthetic Metals
Journal title :
Synthetic Metals
