Title of article
Aging induced traps in organic semiconductors
Author/Authors
Steiger، نويسنده , , J. and Karg، نويسنده , , S. and Schmechel، نويسنده , , R. and von Seggern، نويسنده , , H.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2001
Pages
4
From page
49
To page
52
Abstract
Trap states in organic single layer devices have been detected by the method of thermally stimulated currents (TSC). These devices have been exposed to potentially harmful atmospheres of oxygen and humid nitrogen in order to investigate the influence of a
Keywords
Thermally stimulated currents , Organic light emitting diodes , traps , Degradation
Journal title
Synthetic Metals
Serial Year
2001
Journal title
Synthetic Metals
Record number
2074965
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