Title of article :
Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films
Author/Authors :
Losurdo، نويسنده , , M. and Giangregorio، نويسنده , , M.M. and Capezzuto، نويسنده , , P. and Bruno، نويسنده , , G. and Babudri، نويسنده , , F. and Colangiuli، نويسنده , , D. and Farinola، نويسنده , , G.M. and Naso، نويسنده , , F.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2003
Pages :
5
From page :
49
To page :
53
Abstract :
The correlation between the optical properties and microstructural parameters of organic semiconductor polymeric thin films is investigated by spectroscopic ellipsometry. Different poly(arylenephenylene)-based films have been deposited by spincoating. The
Keywords :
spectroscopic ellipsometry , Organic polymeric films , Optical properties , Conjugated Polymers
Journal title :
Synthetic Metals
Serial Year :
2003
Journal title :
Synthetic Metals
Record number :
2078687
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2078687
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