Title of article :
Dark spot formation relative to ITO surface roughness for polyfluorene devices
Author/Authors :
Liu، نويسنده , , Gao and Kerr، نويسنده , , John B and Johnson، نويسنده , , Steve، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2004
Abstract :
The failure behaviors of ITO/PEDOT;PSS/polyfluorene/Al devices are different depending on the surface roughness of the sputtered ITO anode film. The spikes on ITO surface are responsible for the initial local shorts of the device, which develop into dark
Keywords :
OLED , Failure mechanism , ITO surface , Dark spot , Interface
Journal title :
Synthetic Metals
Journal title :
Synthetic Metals
