In situ electrical characterization of DH4T field-effect transistors
Author/Authors :
Muck، نويسنده , , T. and Wagner، نويسنده , , V. and Bass، نويسنده , , U. and Leufgen، نويسنده , , M. and Geurts، نويسنده , , J. and Molenkamp، نويسنده , , L.W.، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2004
Pages :
4
From page :
317
To page :
320
Abstract :
We present an in situ electrical analysis of organic thin film transistors (OTFTs) during the deposition of the active layer of dihexylquaterthiophene (DH4T). At elevated temperatures (90 °C) DH4T films exhibit a smectic mesophase with extremely large 2D
Keywords :
Organic thin film transistors , Monolayers , Dihexylquaterthiophene
