• Title of article

    Modelling topographical artifacts in scanning near-field optical microscopy

  • Author/Authors

    Fenwick، نويسنده , , Oliver and Latini، نويسنده , , Gianluca and Cacialli، نويسنده , , Franco، نويسنده ,

  • Issue Information
    دوماهنامه با شماره پیاپی سال 2004
  • Pages
    3
  • From page
    171
  • To page
    173
  • Abstract
    Scanning probe techniques such as atomic force microscopy and scanning tunnelling microscopy have been used extensively for the study of surface properties on the nanoscale. A valuable, but less commonly used technique is scanning near-field optical micro
  • Keywords
    Artifacts , SNOM , Probe radius , Simulation
  • Journal title
    Synthetic Metals
  • Serial Year
    2004
  • Journal title
    Synthetic Metals
  • Record number

    2081042

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2081042