Title of article
Measurement of molecular order and orientation in nanoscale organic films
Author/Authors
Watts، نويسنده , , B. and Thomsen، نويسنده , , L. and Dastoor، نويسنده , , P.C.، نويسنده ,
Issue Information
دوماهنامه با شماره پیاپی سال 2005
Pages
4
From page
21
To page
24
Abstract
Self-assembled monolayers (SAMs) have, in recent years, attracted much interest for surface modification, surface coatings and as interfacial coupling agents. X-ray photoelectron spectroscopy (XPS) and carbon K-edge near edge X-ray absorption fine structu
Keywords
Organic/inorganic interfaces , Coatings , X-ray absorption spectroscopy , Polycrystalline surfaces
Journal title
Synthetic Metals
Serial Year
2005
Journal title
Synthetic Metals
Record number
2081412
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