Surface structure reflectometry with X-rays

X-ray surface scattering is rapidly emerging as a popular technique for rapid in situ nondestructive characterization of surfaces and interfaces. Applications have been very widespread and have ranged from studies of film growth and morphology to molecular ordering at solid/liquid and free fluid interfaces. There has also been increased emphasis on the analysis of off-specular surface X-ray scattering to characterize interface roughness and growth morphology.