Title of article :
Characterization of the field-effect conductivity distribution in pentacene thin-film transistors by a near-field scanning microwave microscope
Author/Authors :
Babajanyan، نويسنده , , Arsen and Melikyan، نويسنده , , Harutyun and Carnis، نويسنده , , Jerome and Yoon، نويسنده , , Youngwoon and Lee، نويسنده , , Hanju and Yoo، نويسنده , , Hyung Keun and Lee، نويسنده , , Kiejin and Friedman، نويسنده , , Barry، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2011
Pages :
6
From page :
931
To page :
936
Abstract :
Direct probing of the conductivity distribution in organic materials is motivated by the need to obtain a deeper understanding of carrier behavior in organic thin-film transistors (OTFT), organic electro-luminescent devices, organic photoconductors, and organic biosensors. Here we used a near-field scanning microwave microscope to visualize conductivity profiles in OTFT channel. Applying this technique to pentacene field-effect transistors has revealed changes of the conductivity distribution in the channel arising from the development and exhaustion of an accumulated charge region. The electric field profiles, the complementary image of conductivity profiles, which are visualized by using an optical second harmonic generation method, support the results. We anticipate that direct observation by this microwave method will find wide application in measurement of carrier conductivity in organic and nonorganic materials.
Keywords :
pentacene , Conductivity distribution , Field-effect transistor , Microwave microscope
Journal title :
Synthetic Metals
Serial Year :
2011
Journal title :
Synthetic Metals
Record number :
2088084
Link To Document :
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