Title of article :
Methods in determination of morphological degradation of polymer:fullerene solar cells
Author/Authors :
Turkovic، نويسنده , , Vida and Engmann، نويسنده , , Sebastian and Gobsch، نويسنده , , Gerhard and Hoppe، نويسنده , , Harald، نويسنده ,
Issue Information :
دوماهنامه با شماره پیاپی سال 2012
Pages :
6
From page :
2534
To page :
2539
Abstract :
The changes in the blend morphology of the thin films accelerate when thermally annealed at increased temperatures. Tapping-mode atomic force microscopy (AFM) measurements provide deeper insight into the nano- and micro-meter scale of the phase separation observable on the surface of the film. Furthermore, to prove the coarsening of phase separation on various length scales, optical microscopy, UV–Vis, photoluminescence and measurements were conducted. Of special interest is tracking down the formation of fullerene aggregates and correlation of their growth in time. We demonstrate ways to detect characteristic stages of phase separation directly using simple optical measurements.
Keywords :
Degradation , atomic force microscopy , PCBM , P3HT , Bulk heterojunction , UV–vis spectroscopy , Optical microscopy , morphology , Photoluminescence , Thermal annealing
Journal title :
Synthetic Metals
Serial Year :
2012
Journal title :
Synthetic Metals
Record number :
2088481
Link To Document :
بازگشت