Title of article :
Reaction kinetics in silicon chemical vapor deposition
Author/Authors :
Tonokura، نويسنده , , Kenichi and Koshi، نويسنده , , Mitsuo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
7
From page :
479
To page :
485
Abstract :
Gas-phase reactions of simple silicon hydride species underlying many types of chemical vapor deposition processes for silicon-based thin-film growth are reviewed in this paper. Mass spectrometry and laser-based spectroscopy are applied to identify gas-phase intermediates in thermal and hot-wire chemical vapor deposition processes. The mechanism of the thermal decomposition of silanes, including reactions that lead to the formation of hydrogenated silicon clusters, is examined. The gas-phase chemical kinetic mechanism in hot-wire chemical vapor deposition is proposed to explain precursor molecules for the film growth.
Journal title :
Current Opinion in Solid State and Materials Science
Serial Year :
2002
Journal title :
Current Opinion in Solid State and Materials Science
Record number :
2088812
Link To Document :
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