Title of article
Local behavior of complex materials: scanning probes and nano structure
Author/Authors
Bonnell، نويسنده , , Dawn A and Shao، نويسنده , , Rui، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
11
From page
161
To page
171
Abstract
Understanding the behavior of complex materials such as organic self-assembled monolayers, molecular and nano wires, and transition metal oxide thin films, is facilitated by probes of local properties. Recent extensions of scanning probe microscopies that extract electrical potential, capacitance, dielectric constant, electromechanical coupling coefficients and impedance, are described. In most cases, these complex properties are accessed by stimulations and/or response function detection with multiple frequency modulations. Several illustrative examples include determination of the electronic structure of individual defects in a carbon nanotube, ferroelectric domain interactions in oxide thin films, and electric potential of an alkanethiol on metal.
Keywords
Scanning probe microscopy , Relaxation , Spatial resolution , complex materials , Multiple modulation
Journal title
Current Opinion in Solid State and Materials Science
Serial Year
2003
Journal title
Current Opinion in Solid State and Materials Science
Record number
2088867
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