• Title of article

    Local behavior of complex materials: scanning probes and nano structure

  • Author/Authors

    Bonnell، نويسنده , , Dawn A and Shao، نويسنده , , Rui، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    11
  • From page
    161
  • To page
    171
  • Abstract
    Understanding the behavior of complex materials such as organic self-assembled monolayers, molecular and nano wires, and transition metal oxide thin films, is facilitated by probes of local properties. Recent extensions of scanning probe microscopies that extract electrical potential, capacitance, dielectric constant, electromechanical coupling coefficients and impedance, are described. In most cases, these complex properties are accessed by stimulations and/or response function detection with multiple frequency modulations. Several illustrative examples include determination of the electronic structure of individual defects in a carbon nanotube, ferroelectric domain interactions in oxide thin films, and electric potential of an alkanethiol on metal.
  • Keywords
    Scanning probe microscopy , Relaxation , Spatial resolution , complex materials , Multiple modulation
  • Journal title
    Current Opinion in Solid State and Materials Science
  • Serial Year
    2003
  • Journal title
    Current Opinion in Solid State and Materials Science
  • Record number

    2088867