Title of article :
Processing dependences of microstructure of ferroelectric thin films
Author/Authors :
Haiyan، نويسنده , , He، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Abstract :
Ferroelectric thin film has been widely investigated in detail in recent years. The ferroelectric properties of thin films are obviously dependent on the microstructure of the film, which is influenced by some processing parameters for preparing the films, including precursor solution chemistry, nature of substrate, film thickness, and condition of heat treatment etc. In this paper, these processing dependences of the films are reviewed.
Keywords :
Thin film , microstructure , Processing effect , orientation , ferroelectricity
Journal title :
Current Opinion in Solid State and Materials Science
Journal title :
Current Opinion in Solid State and Materials Science