• Title of article

    Transmission electron microscopy of chalcogenide thin-film photovoltaic materials

  • Author/Authors

    Yan، نويسنده , , Yanfa and Al-Jassim، نويسنده , , Mowafak M. and Yan، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2012
  • Pages
    6
  • From page
    39
  • To page
    44
  • Abstract
    Thin-film photovoltaic modules hold great promise to produce sustainable, low-cost, and clean electricity from sunlight, because thin-film solar cells can potentially be fabricated by economical, high-volume manufacturing techniques. However, to achieve high sunlight-to-electricity conversion efficiency, thin-film solar cells require sophisticated control on interface formation and materials qualities. Transmission electron microscopy (TEM) provides unique methods to access this information at the nanometer scale. In this paper, we provide a brief review on TEM studies of the interfaces, microstructure, and lattice defects in chalcogenide thin-film photovoltaic materials. We analyze the potential effects of the observed interface formation and materials quality that could affect the performance of solar cells.
  • Keywords
    Photovoltaic , CdTe , CIGS , TEM , Interface , DEFECT , solar cell
  • Journal title
    Current Opinion in Solid State and Materials Science
  • Serial Year
    2012
  • Journal title
    Current Opinion in Solid State and Materials Science
  • Record number

    2089296