The comparison of electrical characterizations and photovoltaic performance of Al/p-Si and Al/Azure C/p-Si junctions devices

The current–voltage (I–V) and capacitance–voltage (C–V) characteristics of Al/Azure C/p-Si heterojunction fabricated with spin coating system have been investigated under illumination conditions, coating thickness at room temperature. Some heterojunction parameters such as ideality factor and barrier height were obtained to be 1.10, 1.15, and 1.26, and 0.57 eV, 0.64 eV and 0.65 eV for undoped, doped 2 μl/cm2, and 4 μl/cm2, respectively from the current–voltage measurement by thermionic emission current equation. It was observed that the ideality factor, barrier height and photovoltaic performance have increased and the device capacitance decreased with increasing organic layer thickness.