Title of article
Raman microprobe analysis of patterned high Tc superconductor (YBCO) thin films
Author/Authors
Jiménez، نويسنده , , J. and Martin، نويسنده , , E. and Martin، نويسنده , , P. and Torres، نويسنده , , A. and Belouet، نويسنده , , C. and Chambonnet، نويسنده , , D.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
8
From page
771
To page
778
Abstract
MicroRaman spectroscopy is used for studying patterning induced structural damage in PLD (Pulsed Laser Deposition) YBaCuO High Tc superconductor thin films. The study was focused on the oxygen sublattice vibrations, which give information about different structural aspects of the films. A significant oxygen loss and the presence of residual stresses for laser ablation and ion etching patterning procedures were found. No appreciable consequences at the microRaman resolution scale were detected when patterning was done by wet etching with EDTA (Ethylene Diamine Tetra Acetic Acid).
Journal title
Materials Research Bulletin
Serial Year
1995
Journal title
Materials Research Bulletin
Record number
2092838
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