Epitaxially grown LaNiO3 thin films on SrTiO3(100) substrates by the chemical solution method

LaNiO3 (LNO) thin films were spin-coated onto the SrTiO3(100) (STO) substrates by the chemical solution method. X-ray diffraction (XRD) θ-2θ scans and X-ray β scans were used to determine the crystallinity and in-plane alignment behavior of the films. XRD patterns showed that the LNO thin films obtained by annealing at 600–750°C were highly oriented, while the film annealed at 800°C had random orientation. The resistivity vs. temperature curve of the epitaxially grown film annealed at 750°C, confirmed by β scanning, showed that the film possessed good metallic character. The fracture cross section of the epitaxial LNO film on STO was uniform and dense along the cross section direction.