• Title of article

    Structural and electrical characterization of Bi5Ti3Fe1–xMnxO15 system

  • Author/Authors

    Ahn، نويسنده , , Sung-lak and Noguchi، نويسنده , , Yuji and Miyayama، نويسنده , , Masaru and Kudo، نويسنده , , Tetsuichi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    10
  • From page
    825
  • To page
    834
  • Abstract
    Solid solutions in bismuth layer structured Bi5Ti3Fe1–xMnxO15 (x = 0–1) system were prepared, and evaluations of crystal structure and electrical properties were performed. Polycrystalline samples were synthesized by the solid-state reaction technique using component oxides, and their powder X-ray diffraction (XRD) patterns were analyzed by the Rietveld method using the RIETAN program. The Bi5Ti3FeO15 structure was maintained in the region of 0 ≤ x ≤ 0.4, but a structural change was suggested at x ≥ 0.5. The substitution of Fe3+ site by Mn3+ ion in Bi5Ti3FeO15 was found to shift the Curie temperature Tc toward the low-temperature region and to decrease the dielectric permittivity at Tc in the region of 0 ≤ x ≤ 0.4. The relationship between atomic displacement of B site ions (Ti4+, Fe3+, Mn3+) and the Curie temperature is discussed.
  • Keywords
    A. Layered compounds , D. Crystal structure , D. Dielectric properties , D. Phase transitions
  • Journal title
    Materials Research Bulletin
  • Serial Year
    2000
  • Journal title
    Materials Research Bulletin
  • Record number

    2094847