Title of article :
X-ray reflectivity prove of Langmuir–Blodgett superlattice formation of lead and yttrium stearate alternative bilayers
Author/Authors :
Bukreeva، نويسنده , , T.V and Feigin، نويسنده , , L.A and Arslanov، نويسنده , , V.V and Antolini، نويسنده , , R and Belyaev، نويسنده , , V.V and Konovalov، نويسنده , , O.V and Myagkov، نويسنده , , I.V and Novoselova، نويسنده , , E.G and Smirnov، نويسنده , , I.S، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
5
From page :
129
To page :
133
Abstract :
Multilayer Langmuir–Blodgett (LB) films with X-ray contrast in between the neighbouring bilayers is proposed as an object for the investigation of the interlayer diffusion. Yttrium and lead stearates are chosen to form such kind of films. A double-section LB trough was used for deposition. X-ray reflectivity measurements are used to examine the formatted LB films. X-ray reflectivity data have verified that highly ordered LB films with alternating of yttrium stearate and lead stearate bilayers are obtained. Sharp Bragg peaks occur up to 11th order. Size of the corresponding one-dimensional elementary unit cell is about 100 Å (yttrium stearate bilayer+lead stearate bilayer). A system of well-defined Kiessig fringes between the Bragg peaks is also observed. From the positions of the Kiessig fringes, the thickness of the films (from 200 to 1000 Å) was calculated. These values absolutely correspond to the number of the deposition cycles multiplied on the monolayer thickness.
Keywords :
Langmuir–Blodgett films , X-Ray scattering , Superlattice , Lead stearate , Yttrium stearate
Journal title :
Materials Science and Engineering C
Serial Year :
2002
Journal title :
Materials Science and Engineering C
Record number :
2095663
Link To Document :
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