Title of article
Fractal nature of crystalline–crystalline interface in CuInSe2 thin films
Author/Authors
Malar، نويسنده , , P and Kasiviswananthan، نويسنده , , S and Devanathan، نويسنده , , Ram and Damodara Das، نويسنده , , V، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
6
From page
1475
To page
1480
Abstract
The characteristics of sub-micron scale crystalline–crystalline interface roughness in CuInSe2 thin films have been studied using transmission electron microscopy. The interface is formed by local recrystallization of CuInSe2 films using electron beam irradiation in a transmission electron microscope. Analysis of the interface data obtained from the electron micrographs suggested that the interface shows self-affine fractal scaling with a static scaling exponent of 0.97±0.02.
Keywords
A. Semiconductors , A. Thin films , B. vapor deposition , C. Electron microscopy , D. Microstructure
Journal title
Materials Research Bulletin
Serial Year
2002
Journal title
Materials Research Bulletin
Record number
2095864
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