Fractal nature of crystalline–crystalline interface in CuInSe2 thin films

The characteristics of sub-micron scale crystalline–crystalline interface roughness in CuInSe2 thin films have been studied using transmission electron microscopy. The interface is formed by local recrystallization of CuInSe2 films using electron beam irradiation in a transmission electron microscope. Analysis of the interface data obtained from the electron micrographs suggested that the interface shows self-affine fractal scaling with a static scaling exponent of 0.97±0.02.