Author/Authors :
Xiong، نويسنده , , C.S and Xiong، نويسنده , , Y.H. and Jia، نويسنده , , Y.B. and Jian، نويسنده , , Z.P. and Zhou، نويسنده , , Ge and Pi، نويسنده , , Anna L. and Mai، نويسنده , , Y.T. and Xia، نويسنده , , Z.C and Yuan، نويسنده , , S.L.، نويسنده ,
Abstract :
La0.67Sr0.33MnO3−δ films, fabricated on (1 1 1) LaAlO3 single-crystal substrates using a direct current magnetron sputtering technique, are demonstrated by X-ray diffraction patterns and pole figures to be high quality epitaxial films and there is a perfect matching relationship between the films and the substrates. We observed an obvious difference of the electronic–magnetic transportation properties among films sputtered on (1 1 1), (1 0 0) and (1 1 0) LaAlO3 substrates, respectively. A mechanism for the difference is discussed briefly.
Keywords :
A. Thin films , D. Electrical properties and magnetic properties , B. Epitaxial growth , C. X-ray diffraction
