Title of article :
Dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs quantum dots
Author/Authors :
Lee، نويسنده , , Chang Yun and Song، نويسنده , , Jin Dong and Kim، نويسنده , , Jong Min and Chang، نويسنده , , Ki Soo and Lee، نويسنده , , Yong Tak and Kim، نويسنده , , Tae Whan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
5
From page :
135
To page :
139
Abstract :
Temperature-dependent photoluminescence (PL) measurements have been carried out to investigate the dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs quantum dots (QDs). The PL spectra showed that the peak corresponding to the interband transitions form the ground electronic subband to the ground heavy-hole band (E0-HH1) of the InAs QDs shifted to a higher energy side with increasing the GaAs spacer thickness and that the full width at maximum (FWHM) of the (E0-HH1) peak rapidly decreased with increasing a spacer thickness. The position energy and the FWHM of the (E0-HH1) peak for the InAs/GaAs QDs at several temperatures were observed. The present observations can help improve understanding of the dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs QDs.
Keywords :
A. Nanostrucutres , B. Epitaxial growth , D. Optical properties
Journal title :
Materials Research Bulletin
Serial Year :
2004
Journal title :
Materials Research Bulletin
Record number :
2096582
Link To Document :
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