Title of article
Trapping parameters of repulsive centers in SbSI single crystals
Author/Authors
?zdemir، نويسنده , , S and F?rat، نويسنده , , T and Mamedov، نويسنده , , A.M، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
9
From page
1065
To page
1073
Abstract
Charge trapping centers in antimony sulphide iodide (SbSI) single crystals have been investigated by the use of thermally stimulated current (TSC) technique. The TSC spectrum consists of only one apparent peak which is found to be associated with a single trapping level. Those traps are experimentally found to obey the monomolecular kinetics. The trapping parameters as the energy depth, temperature dependent frequency factor and capture cross section together with the concentrations of the corresponding discrete trapping level are determined. The TSC signal is found to be strongly dependent on illumination temperature of the sample and this is explained by the model in which the traps are considered to be surrounded by repulsive potential barriers.
Keywords
D. Ferroelectricity , B. Crystal growth
Journal title
Materials Research Bulletin
Serial Year
2004
Journal title
Materials Research Bulletin
Record number
2096762
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