Title of article :
Effects of annealing on luminescence properties of Si nanocrystallites prepared by pulsed laser ablation in inert gas
Author/Authors :
Umezu، نويسنده , , I. and Yamazaki، نويسنده , , G. T. Yamaguchi، نويسنده , , T. and Sugimura، نويسنده , , A. and Makino، نويسنده , , T. and Yamada، نويسنده , , Y. and Suzuki، نويسنده , , N. and Yoshida، نويسنده , , T.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Abstract :
We prepared Si nanocrystallites by pulsed laser ablation in He gas. The photoluminescence (PL) intensity of nanocrystallites increased after annealing by about one order of magnitude. PL spectra depend on annealing process and excitation photon energy. We observed a broad peak around 2 eV in the PL spectra of the as-deposited sample when excited at 2.5 eV. The full width at half-maximum (FWHM) of the PL peak increased with annealing due to an increase in the broad 1.7 eV component. The PL spectrum when excited at 3.8 eV is composed of peaks at 1.7, 2.0 and 3.0 eV. Although the 1.7 eV component was found with both 2.5 and 3.8 eV excitation, the origins of PL differ for these excitations. The electroluminescence (EL) spectra had a peak at 1.7 eV. The peak energy and shape of the EL is similar to the broad 1.7 eV component of the PL when excited at 2.5 eV.
Keywords :
Photoluminescence , Silicon , nanocrystal , Laser ablation , electroluminescence
Journal title :
Materials Science and Engineering C
Journal title :
Materials Science and Engineering C