Title of article :
Surface reactivity of nanostructured tin oxide and Pt-doped tin oxide as studied by EPR and XPS spectroscopies
Author/Authors :
Morazzoni، نويسنده , , F. and Canevali، نويسنده , , C. and Chiodini، نويسنده , , N. and Mari، نويسنده , , C. and Ruffo، نويسنده , , R. and Scotti، نويسنده , , R. and Armelao، نويسنده , , L. and Tondello، نويسنده , , E. and Depero، نويسنده , , L. and Bontempi، نويسنده , , E.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
3
From page :
167
To page :
169
Abstract :
Nanostructured (3–6 nm) thin films (80 nm) of SnO2 and Pt-doped SnO2 were obtained by a new sol–gel route using tetra(tert-butoxy)tin(IV) and bis(acetylacetonato)platinum(II) as precursors. EPR and XPS investigations, performed on thin films after interaction with CO, demonstrated that singly ionized oxygen vacancies (Vo) fully transferred their electrons to the noble metal and reduced Pt(IV) to Pt(II). Contact with air at room temperature led to the reduction of O2 to O2−, therefore, re-oxidizing metal centers. The reaction mechanism concords with the high electrical sensitivity of this material.
Keywords :
Pt-doped SnO2 , Nanostructured thin films , XPS , EPR
Journal title :
Materials Science and Engineering C
Serial Year :
2001
Journal title :
Materials Science and Engineering C
Record number :
2097341
Link To Document :
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