Title of article :
Microwave dielectric characteristics of Mg(Ta1−xNbx)2O6 ceramics
Author/Authors :
Tzou، نويسنده , , Wen-Cheng and Chen، نويسنده , , Ying-Chung and Yang، نويسنده , , Cheng-Fu and Cheng، نويسنده , , Chien-Min، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Abstract :
The crystalline phase and the microwave dielectric properties of the Mg(Ta1−xNbx)2O6 ceramics have been investigated. Combining the positive temperature coefficient of the resonant frequency (τf) material (MgTa2O6, τf = +30 ppm/°C) with the negative one (MgNb2O6, τf = −70 ppm/°C) can produce the composite with τf ∼ 0 ppm/°C. The crystal structure of pure MgTa2O6 ceramic is the tetragonal structure. For x = 0.15, the crystal structure of the solid solution was the coexistence of the tetragonal structure and orthorhombic structure. Solid solutions with 0.25 ≦ x ≦ 1 exhibit the orthorhombic structure, which is like the structure of pure MgNb2O6 ceramic. The sintered morphologies of Mg(Ta1−xNbx)2O6 ceramics gradually change from the disk-typed grains (x = 0 and 0.15) to the disk-typed and bar-typed grains coexist (x = 0.35, 0.5, and 0.7), and then reveal the bar-typed grains (x = 0.85 and 1). The densities, dielectric constants (ɛr) and τf values of Mg(Ta1−xNbx)2O6 ceramics decrease with the increase of the MgNb2O6 content. The quality factor (Q × f) reaches the minimum value at x = 0.15, and then increases with the increase of the MgNb2O6 content. The Mg(Ta1−xNbx)2O6 ceramic with x = 0.25 sintered at 1450 °C exhibits a minimum τf value of −0.7 ppm/°C.
Keywords :
A. Ceramics , C. X-ray diffraction , D. Dielectric properties
Journal title :
Materials Research Bulletin
Journal title :
Materials Research Bulletin