Title of article
Spectroscopy studies by reflectance and photoluminescence on shallow quantum wells AlxGa1−xAs/GaAs types
Author/Authors
Chaouache، نويسنده , , M. and Chtourou، نويسنده , , R. and Charfi-Kaddour، نويسنده , , F.F. and Marzin، نويسنده , , Yves Le Bloch، نويسنده , , J.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
227
To page
230
Abstract
We report an experimental study by photoluminescence (PL) and reflectivity on shallow quantum wells of Ga1−xAlxAs/GaAs type performed at 10 K and varying aluminium concentration from 1.5% to 4.5%. We present an approach to the investigation of the reflectivity line shape. The calculations of the reflectance line shapes using the classical model of linear dispersion show good agreement with the experimental spectra, in particular, the two types of the line shapes: “dip” for the quantum well and “peak” for the barrier exciton.
Keywords
Reflectance , exciton , Shallow quantum well , Line shape
Journal title
Materials Science and Engineering C
Serial Year
2002
Journal title
Materials Science and Engineering C
Record number
2097890
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