Title of article
Complementarity of capacitance transient spectroscopy and drain current transient spectroscopy to detect traps in HEMTs
Author/Authors
Dermoul، نويسنده , , I and Chekir، نويسنده , , F and Ben Salem، نويسنده , , M and Maaref، نويسنده , , H، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
241
To page
244
Abstract
This work deals with the performances of two electrical techniques to characterize deep levels in HEMTs. Capacitance Deep Level Transient Spectroscopy (DLTS) is a well-known method and its efficiency is now proved, whereas Drain Current Transient Spectroscopy (DCTS) provides information about the location of traps in the structure. Experimental results establish the complementarity of these two techniques.
Keywords
DCTS , HEMT , DLTS
Journal title
Materials Science and Engineering C
Serial Year
2002
Journal title
Materials Science and Engineering C
Record number
2097897
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