Title of article
Electronic structure calculations for Si/Si1−xGex multi-quantum well devices
Author/Authors
Ben Zid، نويسنده , , F and Bhouri، نويسنده , , A and Mejri، نويسنده , , H and Said، نويسنده , , M and Bouarissa، نويسنده , , N and Lazzari، نويسنده , , J.-L and Arnaud dʹAvitaya، نويسنده , , F and Derrien، نويسنده , , J، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
5
From page
959
To page
963
Abstract
We present a numerical simulation of the conduction-band diagram of a resonant tunneling diode in the Si/Si1−xGex system by solving self-consistently Schrödinger and Poisson equations with and without an applied electric field. An analysis of the Stark effect was made in the investigated heterostructure. A particular attention has been paid to the effect of temperature on the electronic behaviour of the modelled heterostructure. We also present calculation of electric field-dependent interband transitions in the Si/Si1−xGex resonant tunneling heterostructure.
Keywords
Numerical simulation , Si/Si1?xGex , Resonant tunneling diode
Journal title
Materials Science and Engineering C
Serial Year
2003
Journal title
Materials Science and Engineering C
Record number
2098191
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