• Title of article

    Thermal stability of the Mobil Five type metallosilicate molecular sieves—An in situ high temperature X-ray diffraction study

  • Author/Authors

    Bhange، نويسنده , , D.S. and Ramaswamy، نويسنده , , Veda، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2007
  • Pages
    10
  • From page
    851
  • To page
    860
  • Abstract
    We have carried out in situ high temperature X-ray diffraction (HTXRD) studies of silicalite-1 (S-1) and metallosilicate molecular sieves containing iron, titanium and zirconium having Mobil Five (MFI) structure (iron silicalite-1 (FeS-1), titanium silicalite-1 (TS-1) and zirconium silicalite-1 (ZrS-1), respectively) in order to study the thermal stability of these materials. Isomorphous substitution of Si4+ by metal atoms is confirmed by the expansion of unit cell volume by X-ray diffraction (XRD) and the presence of Si–O–M stretching band at ∼960 cm−1 by Fourier transform infrared (FTIR) spectroscopy. Appearance of cristobalite phase is seen at 1023 and 1173 K in S-1 and FeS-1 samples. While the samples S-1 and FeS-1 decompose completely to cristobalite at 1173 and 1323 K, respectively, the other two samples are thermally stable upto 1623 K. This transformation is irreversible. Although all materials show a negative lattice thermal expansion, their lattice thermal expansion coefficients vary. The thermal expansion behavior in all samples is anisotropic with relative strength of contraction along ‘a’ axes is more than along ‘b’ and ‘c’ axes in S-1, TS-1, ZrS-1 and vice versa in FeS-1. Lattice thermal expansion coefficients (αv) in the temperature range 298–1023 K were −6.75 × 10−6 K−1 for S-1, −12.91 × 10−6 K−1 for FeS-1, −16.02 × 10−6 K−1 for TS-1 and −17.92 × 10−6 K−1 for ZrS-1. The highest lattice thermal expansion coefficients (αv) obtained were −11.53 × 10−6 K−1 for FeS-1 in temperature range 298–1173 K, −20.86 × 10−6 K−1 for TS-1 and −25.54 × 10−6 K−1 for ZrS-1, respectively, in the temperature range 298–1623 K. Tetravalent cation substitution for Si4+ in the lattice leads to a high thermal stability as compared to substitution by trivalent cations.
  • Keywords
    C. X-ray diffraction , A. Microporous materials , D. Thermal expansion
  • Journal title
    Materials Research Bulletin
  • Serial Year
    2007
  • Journal title
    Materials Research Bulletin
  • Record number

    2098220