Title of article
Field effect on electron-hole recombination in Si/Si1−xGex/Si quantum wells having a W-like type II potential profile
Author/Authors
N. Sfina، نويسنده , , N. and Lazzari، نويسنده , , J.-L. and Said، نويسنده , , M.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
214
To page
217
Abstract
A theoretical analysis, using a Schrödinger solver, is made to calculate the electric field-dependent interband transitions in a Si/Si1−xGex/Si double QW strain-compensated in relaxed Si1−yGey barriers. The conduction and the valence band present a W-like potential profile, resulting in a quasi-type I heterostructure. Three peculiar features are revealed as the electric field is increased: (i) two uncoupled e11 and e12 electron levels are generated, (ii) the e11–hh1 fundamental transition due to first silicon QW exhibits a red shift in emission energy while the e12–hh1 transition energy is bleu shifted, (iii) an improved wave function overlap for the e11–h1 fundamental transition, the latter property showing the advantage having two adjacent QWs in this W architecture.
Keywords
Quantum wells , Band structure engineering , Strained SiGe , Electric field
Journal title
Materials Science and Engineering C
Serial Year
2006
Journal title
Materials Science and Engineering C
Record number
2098631
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