Title of article
Effect of gas flow rate on surface morphology and crystal quality of ZnTe epilayers grown on GaAs substrates
Author/Authors
Guo، نويسنده , , Qixin and Nada، نويسنده , , Masaki and Ding، نويسنده , , Yaliu and Saito، نويسنده , , Katsuhiko and Tanaka، نويسنده , , Tooru and Nishio، نويسنده , , Mitsuhiro، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
4
From page
551
To page
554
Abstract
The effect of gas flow rate on surface morphology and crystal quality of ZnTe layers grown on the (1 0 0) GaAs substrates by atmospheric pressure metalorganic vapor phase epitaxy with dimethylzinc and diethyltelluride as the source materials was investigated. The surface morphology of the ZnTe epilayers is significantly improved with increasing the total gas flow rate. X-ray rocking curve and photoluminescence measurements indicate that the total gas flow rate plays a vital role in the growth characteristics of the ZnTe epilayers, and the ZnTe epilayer with best crystal quality is obtained at the total gas flow rate around 300 standard cubic centimeters per minute (sccm) in this work.
Keywords
C. Atomic force microscopy , B. Epitaxial growth , D. Luminescence , A. Semiconductor
Journal title
Materials Research Bulletin
Serial Year
2011
Journal title
Materials Research Bulletin
Record number
2100757
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