Title of article :
Structure refinement for tantalum nitrides nanocrystals with various morphologies
Author/Authors :
Liu، نويسنده , , Lianyun and Huang، نويسنده , , Kai-Peng Hou، نويسنده , , Jungang and Zhu، نويسنده , , Hongmin، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Abstract :
Tantalum nitrides (TaNx) nanocrystals with different phase and morphology have been synthesized through homogenous sodium reduction under low temperature with the subsequent annealing process under high vacuum. The crystal structures of tantalum nitrides were determined by Rietveld refinement based on the X-ray diffraction data. The morphologies of various tantalum nitrides nanocrystals in high quality were analyzed through the electron microcopies examinations. The spherical TaN nanoparticles, cuboidal TaN0.83 and TaN0.5 nanocrystals have been selectively prepared at different annealing temperatures. In addition, the specific surface areas of the tantalum nitrides nanocrystals measured by BET method were around 9.87–11.64 m2 g−1, indicating that such nano-sized tantalum nitrides could be suitable for capacitor with high specific capacitance.
Keywords :
C. X-ray diffraction , A. Nitrides , A. Nanostructures , D. Crystal structure
Journal title :
Materials Research Bulletin
Journal title :
Materials Research Bulletin